Researcher
Enrique Miranda
Universitat Autònoma de Barcelona
Statistics
222 papers found
Papers authored by Enrique Miranda
Refreshing results…
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E. O’Connor,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O’Connell,
P. K. Hurley ,
G. Hughes,
P. Casey
Electrical characterization of the soft breakdown failure mode in MgO layers
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P. Falbo,
M. Nafria,
F. Crupi
Progressive breakdown dynamics in HfSiON/SiON gate stacks
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F. J. García Sánchez,
J. Muci
Compatibility of co-tunneling and power-law models of soft breakdown current in MOS structures
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P. Falbo,
M. Nafría,
F. Crupi
Electron transport through electrically induced nanoconstrictions in HfSiON gate stacks
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J. Tinoco,
I. Garduno,
M. Estrada,
A. Cerdeira
Equivalent Electrical Circuit Model for the Post-Breakdown Current in SiO2/TiO2 Gate Stacks
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Xavier Cartoixà,
Enrique Miranda ,
Jordi Suñé,
Ferney Alveiro Chaves,
Stephan Roche
A drain current model for Schottky-barrier CNT-FETs
Download from link.springer.com
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J. Sũé,
X. Cartoixa,
E. Miranda ,
J. Sune,
F. A. Chaves,
S. Roche
A simple drain current model for Schottky-barrier carbon nanotube field effect transistors
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Adelmo Ortiz-Conde,
Francisco J. Garcia Sanchez,
Eduardo Farkas-Sosa
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F. Garcia Sanchez,
E. Farkas,
S. Malobabic
Modeling the Post-Breakdown Current in MOS devices on p-silicon substrate
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