Published in
American Institute of Physics, Applied Physics Letters, 1(95), p. 012901
DOI: 10.1063/1.3167827
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Electrical characterization of the soft breakdown failure mode in MgO layers
Journal article published in 2009 by
E. Miranda 
,
E. O’Connor,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O’Connell,
P. K. Hurley ,
G. Hughes,
P. Casey
,
E. O’Connor,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O’Connell,
P. K. Hurley ,
G. Hughes,
P. Casey
This paper is available in a repository.
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