Barry Brennan - Dissemin

All papers authored by Barry Brennan

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2020 Naresh Kumar

, Sofia Marchesini, Thomas Howe, Lee Edwards

, Barry Brennan

, Andrew J. Pollard

Nanoscale characterization of plasma functionalized graphitic flakes using tip-enhanced Raman spectroscopy

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Elizabeth J. Legge, Keith R. Paton

, Magdalena Wywijas, Greg McMahon, Rory Pemberton, Naresh Kumar

, Arun Prakash Aranga Raju, Craig P. Dawson, Andrew J. Strudwick, James W. Bradley, Vlad Stolojan, S. Ravi P. Silva

, Stephen A. Hodge

, Barry Brennan

, Andrew J. Pollard

Determining the Level and Location of Functional Groups on Few-Layer Graphene and Their Effect on the Mechanical Properties of Nanocomposites

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This paper is made freely available by the publisher.

2019 Philipp Braeuninger-Weimer

, Oliver Burton, Robert S. Weatherup

, Ruizhi Wang, Pavel Dudin, Barry Brennan

, Andrew J. Pollard, Bernhard C. Bayer, Vlad P. Veigang-Radulescu, Jannik C. Meyer, Billy J. Murdoch, Peter J. Cumpson, Stephan Hofmann

Reactive intercalation and oxidation at the buried graphene-germanium interface

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This paper was not found in any repository; the policy of its publisher is unknown or unclear.

Oliver J. Burton, Vitaliy Babenko, Vlad-Petru Veigang-Radulescu, Barry Brennan

, Andrew J. Pollard, Stephan Hofmann

The Role and Control of Residual Bulk Oxygen in the Catalytic Growth of 2D Materials

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Jaakko Mäkelä

, Antti Lahti, Marjukka Tuominen, Muhammad Yasir, Mikhail Kuzmin, Pekka Laukkanen

, Kalevi Kokko

, Marko P. J. Punkkinen, Hong Dong, Barry Brennan

, Robert M. Wallace

Unusual oxidation-induced core-level shifts at the HfO2/InP interface

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2018 Elizabeth J. Legge

, Muhammad Ahmad

, Christopher T. G. Smith

, Barry Brennan

, Christopher A. Mills

, Vlad Stolojan

, Andrew J. Pollard

, S. Ravi P. Silva

Physicochemical characterisation of reduced graphene oxide for conductive thin films

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2017 C. Byrne, B. Brennan

, R. Lundy, J. Bogan, A. Brady, Y. Y. Gomeniuk, S. Monaghan, P. K. Hurley

, G. Hughes

Physical, chemical and electrical characterisation of the diffusion of copper in silicon dioxide and prevention via a CuAl alloy barrier layer system

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Barry Brennan

, Steve J. Spencer, Natalie A. Belsey, Tsegie Faris, Harry Cronin, S. Ravi P. Silva, Toby Sainsbury, Ian S. Gilmore, Zlatka Stoeva, Andrew J. Pollard

Structural, chemical and electrical characterisation of conductive graphene-polymer composite films

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2016 Conor Byrne, Barry Brennan

, Anthony P. McCoy, Justin Bogan, Anita Brady, Greg Hughes

In Situ XPS Chemical Analysis of MnSiO3 Copper Diffusion Barrier Layer Formation and Simultaneous Fabrication of Metal Oxide Semiconductor Electrical Test MOS Structures

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Philipp Braeuninger-Weimer

, Barry Brennan

, Aj Pollard, Stephan Hofmann

Understanding and Controlling Cu-Catalyzed Graphene Nucleation: The Role of Impurities, Roughness, and Oxygen Scavenging

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2015 Bonnie J. Tyler, Barry Brennan

, Helena Stec, Trupti Patel, Ling Hao, Ian S. Gilmore, Andrew J. Pollard

Removal of Organic Contamination from Graphene with a Controllable Mass-Selected Argon Gas Cluster Ion Beam

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Sandro Mignuzzi, Andrew J. Pollard, Nicola Bonini, Barry Brennan

, Ian S. Gilmore, Marcos A. Pimenta, David Richards, Debdulal Roy

Effect of disorder on Raman scattering of single-layerMoS2

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Sabina Caneva

, Robert S. Weatherup, Bernhard C. Bayer, Barry Brennan

, Steve J. Spencer, Ken Mingard, Andrea Cabrero-Vilatela, Carsten Baehtz, Andrew John Pollard, Stephan Hofmann

Nucleation Control for Large, Single Crystalline Domains of Monolayer Hexagonal Boron Nitride via Si-Doped Fe Catalysts

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Sandro Mignuzzi, Naresh Kumar, Barry Brennan

, Ian S. Gilmore, David Richards, Andrew J. Pollard, Debdulal Roy

Probing individual point defects in graphene via near-field Raman scattering

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2014 Andrew J. Pollard, Barry Brennan

, Helena Stec, Bonnie J. Tyler

, Martin P. Seah, Ian S. Gilmore, Debdulal Roy

Quantitative characterization of defect size in graphene using Raman spectroscopy

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R. V. Galatage, D. M. Zhernokletov, H. Dong, B. Brennan

, C. L. Hinkle, R. M. Wallace

, E. M. Vogel

Accumulation capacitance frequency dispersion of III-V metal-insulator-semiconductor devices due to disorder induced gap states

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Stephen McDonnell, Barry Brennan

, Emin Bursa, Robert M. Wallace

, Konrad Winkler, Peter Baumann

GaSb oxide thermal stability studied by dynamic-XPS

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Hong Dong, Wilfredo Cabrera, Xiaoye Qin, Barry Brennan

, Dmitry Zhernokletov, Christopher L. Hinkle, Jiyoung Kim, Yves J. Chabal, Robert M. Wallace

Silicon Interfacial Passivation Layer Chemistry for High-k/InP Interfaces

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W. Cabrera, B. Brennan

, H. Dong, T. P. O'Regan, I. M. Povey, S. Monaghan, É. O'Connor, P. K. Hurley

, R. M. Wallace

, Y. J. Chabal

Diffusion of In0.53Ga0.47As elements through hafnium oxide during post deposition annealing

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All papers authored by Barry Brennan