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Decreasing Interface Defect Densities via Silicon Oxide Passivation at Temperatures Below 450 °C
UploadUnusual oxidation-induced core-level shifts at the HfO2/InP interface
Download from doi.orgCrystalline and oxide phases revealed and formed on InSb(111)B
Download from doi.orgGlowing synthetic chlorohectorite: The luminescent features of a trioctahedral clay mineral
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