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A Pragmatic Model to Predict Future Device Aging
Download from doi.orgInvestigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing
Download from doi.orgGeSe-Based Ovonic Threshold Switching Volatile True Random Number Generator
UploadUnderstanding charge traps for optimizing Si-passivated Ge nMOSFETs
Download from researchonline.ljmu.ac.ukDefects for Random Telegraph Noise and Negative Bias Temperature Instability
Download from researchonline.ljmu.ac.ukImpact of Hot Carrier Aging on Random Telegraph Noise and Within a Device Fluctuation
Download from dx.doi.orgHot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM
Download from researchonline.ljmu.ac.ukNBTI prediction and its induced time dependent variation
Download from researchonline.ljmu.ac.ukAn Investigation on Border Traps in III–V MOSFETs With an In0.53Ga0.47As Channel
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