Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 7(39), p. 955-958, 2018
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The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique
Journal article published in 2018 by
Zheng Chai 
,
Weidong Zhang ,
Pedro Freitas ,
Firas Hatem ,
Jian Fu Zhang ,
John Marsland,
Bogdan Govoreanu,
Ludovic Goux,
Gouri Sankar Kar,
Steve Hall ,
Paul Chalker ,
John Robertson
,
Weidong Zhang ,
Pedro Freitas ,
Firas Hatem ,
Jian Fu Zhang ,
John Marsland,
Bogdan Govoreanu,
Ludovic Goux,
Gouri Sankar Kar,
Steve Hall ,
Paul Chalker ,
John Robertson
This paper is available in a repository.
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