Cher Ming Tan - Dissemin

All papers authored by Cher Ming Tan

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2020 Qishen Wang

, Karthekeyan Periasamy

, Yi Fu, Ya-Ting Chan, Cher Ming Tan

, Natasa Bajalovic, Jer-Chyi Wang

, Desmond K. Loke

Analytical modeling electrical conduction in resistive-switching memory through current-limiting-friendly combination frameworks

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2018 Udit Narula

, Cher Ming Tan

, Eng Soon Tok

Metal on Graphenated Metal for VLSI Interconnects

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2013 Minh Duc Le, Cher Ming Tan

Optimal maintenance strategy of deteriorating system under imperfect maintenance and inspection using mixed inspectionscheduling

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Cher Ming Tan

, Chao Sung Lai

Systematic Root Cause Analysis for GaP Green Light LED Degradation

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Shuguang Cheng, Cher Ming Tan

, Tianqi Deng, Feifei He, Shuai Zhang, Haibin Su

Investigation of work function and surface energy of aluminum: An ab-initio study

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2012 Yongdian D. Han, Hongyang Y. Jing, S. M. L. Nai, L. Y. Xu, Cher Ming Tan

, J. Wei

Interfacial reaction and shear strength of Ni-coated carbon nanotubes reinforced Sn–Ag–Cu solder joints during thermal cycling

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Kaushik Ghosh, Jiye Zhang, Lin Zhang, Yuanwei Dong, Hongyu Li, Cher Ming Tan

, Guangrui Xia, Chuan Seng Tan

Integration of Low-$κ$ Dielectric Liner in Through Silicon Via and Thermomechanical Stress Relief

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Cher Ming Tan

, Chunmiao Fu

Effectiveness of reservoir length on electromigration lifetime enhancement for ULSI interconnects with advanced technology nodes

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Feifei He, Cher Ming Tan

Comparison of electromigration simulation in test structure and actual circuit

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Y. D. Han, H. Y. Jing, S. M. L. Nai, L. Y. Xu, C. M. Tan

, J. Wei

Effect of Ni-Coated Carbon Nanotubes on Interfacial Reaction and Shear Strength of Sn-Ag-Cu Solder Joints

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Cher Ming Tan

, B. K. Chen, X. Li, Sihan Joseph Chen

Rapid Light Output Degradation of GaN-Based Packaged LED in the Early Stage of Humidity Test

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S. H. Chen, Cher Ming Tan

, G. H. Tan, Feifei F. He

Degradation behavior of high power light emitting diode under high frequency switching

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Asen Asenov, Ulf Schlichtmann, Cher Ming Tan

, Hei Wong, Xing Zhou

ICMAT 2011 : Reliability and variability of semiconductor devices and ICs

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Feifei He, Cher Ming Tan

3D simulation-based research on the effect of interconnect structures on circuit reliability

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Song Lan, Cher Ming Tan

, Kevin Wu

Reliability study of LED driver – a case study of black box testing

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Cher Ming Tan

, Charles Baudot, Yongdian Han, Hongyang Jing

Applications of multi-walled carbon nanotube in electronic packaging

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2011 Cher Ming Tan

, Kheng Tuan Lau

Automated wafer defect map generation for process yield improvement

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Cher Ming Tan

, Minh Due Le

Contamination assessment of inductive couple plasma etching chamber under mixture of recipes using statistical method

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Wei Li, Cher Ming Tan

Black's equation for today's ULSI interconnect Electromigration reliability — A revisit

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Y. D. Han, H. Y. Jing, S. M. L. Nai, L. Y. Xu, C. M. Tan

, J. Wei

Creep mitigation in Sn–Ag–Cu composite solder with Ni-coated carbon nanotubes

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All papers authored by Cher Ming Tan