Published in

Elsevier, Microelectronics Reliability, 9-10(52), p. 2168-2173

DOI: 10.1016/j.microrel.2012.06.069

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Degradation behavior of high power light emitting diode under high frequency switching

Journal article published in 2012 by S. H. Chen, Cher Ming Tan ORCID, G. H. Tan, Feifei F. He
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Visual Light Communication (VLC) is a system that uses light wavelengths that is not injurious to the eye for communication purposes. This system provides a solution to some technological problems such as the increasingly limited availability of conventional bandwidths for electronic equipment. Recent development in solid-state lighting (SSL) allows it to be highly efficient, longer life time and versatile. These advantages made SSL to be highly acceptable by the public and are slowly replacing the conventional fluorescent lamps. The improvement and acceptability of the solid-state lighting allows a great advancement in the development of VLC. However, the focus of the development of SSL has been for lighting purposes and not for VLC system. This work investigate the degradation behavior of SSL under switching condition with various stress condition such as temperature, frequency, modulation index so as to provide the feasibility of the use of SSL for VLC.