Published in
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology
DOI: 10.1109/icsict.2012.6467816
Links
Tools
Effectiveness of reservoir length on electromigration lifetime enhancement for ULSI interconnects with advanced technology nodes
Proceedings article published in 2012 by
Cher Ming Tan 
,
Chunmiao Fu
,
Chunmiao Fu
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 