Paolo Pavan
0000-0001-5420-1797
135 papers found
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An investigation on the role of current compliance in HfO2-based RRAM in HRS using RTN and I-V data
On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization
Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS
RTS noise characterization of HfOx RRAM in high resistive state
RTN analysis with FHMM as a tool for multi-trap characterization in HfOX RRAM
A compact model of hafnium-oxide-based resistive random access memory
Charge Transport and Degradation in HfO2 and HfOx Dielectrics
An Empirical Model for RRAM Resistance in Low- and High-Resistance States
Perimeter and area current components in HfO2 and HfO2−x metal-insulator-metal capacitors
Compact modeling of TANOS program/erase operations for SPICE-like circuit simulations
A WSN system powered by vibrations to improve safety of machinery with trailer
An autonomous wireless sensor network device powered by a RF energy harvesting system
Random Telegraph Signal noise properties of HfOx RRAM in high resistive state
Enhancing safety in vehicles with implement or trailer using an autonomous wireless sensor network system
RF to DC CMOS rectifier with high efficiency over a wide input power range for RFID applications
Leakage current in HfO 2 stacks: From physical to compact modeling
Assessment of Self-Induced Joule-Heating Effect in the $I$–$V$ Readout Region of Polycrystalline $\hbox{Ge}_{2}\hbox{Sb}_{2}\hbox{Te}_{5}$ Phase-Change Memory
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices
Modeling the charge transport and degradation in HfO2 dielectric for reliability improvement and life-time predictions in logic and memory devices
A vibration-powered wireless system to enhance safety in agricultural machinery
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