Norbert Esser
0000-0003-0345-6823
Technische Universität Berlin
123 papers found
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Special issue: Advanced optical diagnostics of surfaces, nanostructures and ultrathin films
Spectroscopic ellipsometry and reflectance anisotropy spectroscopy of biomolecular layers on silicon surfaces
VUV‐ellipsometry on GaN: Probing conduction band properties by core level excitations
Ellipsometry from infrared to vacuum ultraviolet: Structural properties of thin anisotropic guanine films on silicon
Detection of surface states anisotropies at GaAs(001)(2 × 4) decapped surfaces
MOVPE growth and surface reconstructions of GaAsN(001) surfaces
Optical properties of indium nanowires - an adsorption study
Surface states and resonances on Al(110): Ultraviolet photoemission spectroscopy andab initiocalculations
Structural properties of chalcopyrite thin films studied by Raman spectroscopy
Phonon and polarized reflectance spectra fromSi(111)−(4×1)In: Evidence for a charge-density-wave driven phase transition
Model for the effects of surface disorder on reflectance anisotropy spectroscopy
Optical resonances of indium islands on GaAs(001) observed by reflectance anisotropy spectroscopy
Sb-induced(1×1)reconstruction on Si(001)
Ge growth on GaAs(001) surfaces studied by reflectance anisotropy spectroscopy
Optical properties of the Au(110) surface
Growth phases and optical anisotropy of Co on preoxidized Cu(110)
Optical properties of wurtziteAlxGa1−xN(x<0.1) parallel and perpendicular to thecaxis
Analysis of InAs(001) surfaces by reflectance anisotropy spectroscopy
Influence of Sn on the optical anisotropy of single-domain Si(001)
Surface structure of ordered InGaP(001): The(2×4)reconstruction
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