Paul Hurley
0000-0001-5137-721X
University College Cork National University of Ireland
205 papers found
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Electron trapping in buried oxides formed by oxygen implantation
Test structure for investigating activated doping concentrations in polycrystalline silicon
Electrical Properties of HfO2 Films Formed by Ion Assisted Deposition
Process monitoring and defect characterization of single photon avalanche diodes
Electrical properties of thermally oxidised porous silicon
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