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On the geometrical design of integrated Micromegas detectors
Download from www.researchgate.netStrong Efficiency Improvement of SOI-LEDs Through Carrier Confinement
Download from www.researchgate.netTime and voltage dependence of dielectric charging in RF MEMS capacitive switches
Download from www.researchgate.netLow-frequency noise in hot-carrier degraded nMOSFETs
Download from www.researchgate.netMethodology for performing RF reliability experiments on a generic test structure
Download from ris.utwente.nlResults from MPGDs with a Protected TimePix or Medipix-2 Pixel Sensor as Active Anode
Download from infoscience.epfl.chOn the Verification of EEDFs in Plasmas with Silane using Optical Emission Spectroscopy
Download from iopscience.iop.orgReduced temperature dependence of hot carrier degradation in deuterated nMOSFETs
Download from www.researchgate.netCharacterization of dielectric charging in RF MEMS capacitive switches
Download from ris.utwente.nlC-V test structures for metal gate CMOS
Download from ris.utwente.nlA miniaturized multiwire proportional chamber using CMOS wafer scale post-processing
Download from www.researchgate.netCharge Pumping at Radio Frequencies: Methodology, Trap Response and Application
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