Jurriaan Schmitz - Dissemin

Papers authored by Jurriaan Schmitz

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2009 Jan-Laurens P. J. van der Steen, Raymond J. E. Hueting, Jurriaan Schmitz

Extracting Energy Band Offsets on Long-Channel Thin Silicon-on-Insulator MOSFETs

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M. P. J. Tiggelman, K. Reimann, F. Van Rijs, J. Schmitz

, R. J. E. Hueting

On the Trade-Off Between Quality Factor and Tuning Ratio in Tunable High-Frequency Capacitors

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Ihor Brunets, Jisk Holleman, Alexey Y. Kovalgin, Arjen Boogaard, Jurriaan Schmitz

Low-Temperature Fabricated TFTs on Polysilicon Stripes

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Joost Melai, Cora Salm, Sander Smits, Jan Visschers, Jurriaan Schmitz

The electrical conduction and dielectric strength of SU-8

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T. Arguirov, T. Mchedlidze

, M. Kittler, M. Reiche, T. Wilhelm, T. Hoang, J. Holleman, J. Schmitz

Silicon based light emitters utilizing radiation from dislocations; electric field induced shift of the dislocation-related luminescence

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V. M. Blanco Carballo, J. Melai, C. Salm, J. Schmitz

Moisture resistance of SU-8 and KMPR as structural material

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Joost Melai, Cora Salm, Rob Wolters, Jurriaan Schmitz

Qualitative and quantitative characterization of outgassing from SU-8

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A. W. Groenland, R. A. M. Wolters, A. Y. Kovalgin, J. Schmitz

Four point probe structures with buried electrodes for the electrical characterization of ultrathin conducting films

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Jurriaan Schmitz

Special Section on the 2008 International Conference on Microelectronic Test Structures

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Guido T. Sasse, F. G. Kuper, Jurriaan Schmitz

Corrections to "MOSFET Degradation Under RF Stress"

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2008 Raymond J. E. Hueting, Bijoy Rajasekharan, Cora Salm, Jurriaan Schmitz

The charge plasma P-N diode

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Guido T. Sasse, Fred G. Kuper, Jurriaan Schmitz

MOSFET degradation under RF stress

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Jurriaan Schmitz

, Roland Thewes

Special issue devoted to the ESSDERC’07 conference

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Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz

RF CMOS reliability simulations

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Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip

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Victor Manuel Blanco Carballo, Maximilien Chefdeville, Martin Fransen, Harry van der Graaf, Joost Melai, Cora Salm, Jurriaan Schmitz

, Jan Timmermans

A Radiation Imaging Detector Made by Postprocessing a Standard CMOS Chip

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M. Chefdeville, H. van der Graaf, F. Hartjes, J. Timmermans, J. Visschers, Blanco V. M. Carballo, C. Salm, J. Schmitz

, S. Smits, P. Colas, I. Giomataris

Pulse height fluctuations of integrated Micromegas detectors

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Rodolf W. Herfst, Peter G. Steeneken, H. G. A. (Bert) Huizing, H. G. A. Huizing, Jurriaan Schmitz

Center-Shift Method for the Characterization of Dielectric Charging in RF MEMS Capacitive Switches

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R. W. Herfst, P. G. Steeneken, J. Schmitz

, A. J. G. Mank, M. van Gils

Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches

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B. Rajasekharan, C. Salm, R. J. E. Hueting, T. Hoang, J. Schmitz

Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes

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Papers authored by Jurriaan Schmitz