All papers authored by Hongfei Li
Refreshing results…
2017
Hongfei Li 
,
Yuzheng Guo,
John Robertson
,
Yuzheng Guo,
John Robertson
Hydrogen and the Light-Induced Bias Instability Mechanism in Amorphous Oxide Semiconductors
Download from doi.org
Hongfei Li ,
Yuzheng Guo,
John Robertson
,
Yuzheng Guo,
John Robertson
Face Dependence of Schottky Barriers Heights of Silicides and Germanides on Si and Ge
Download from doi.org
N. Sedghi ,
H. Li ,
I. F. Brunell,
K. Dawson ,
Y. Guo,
R. J. Potter ,
J. T. Gibbon ,
V. R. Dhanak,
W. D. Zhang,
J. F. Zhang,
S. Hall ,
J. Robertson,
P. R. Chalker
,
H. Li ,
I. F. Brunell,
K. Dawson ,
Y. Guo,
R. J. Potter ,
J. T. Gibbon ,
V. R. Dhanak,
W. D. Zhang,
J. F. Zhang,
S. Hall ,
J. Robertson,
P. R. Chalker
Enhanced switching stability in Ta2O5 resistive RAM by fluorine doping
Download from researchonline.ljmu.ac.uk
N. Sedghi,
H. Li ,
If F. Brunell,
K. Dawson ,
Rj J. Potter ,
Y. Guo,
Jt T. Gibbon ,
Vr R. Dhanak,
W. D. Zhang,
Jf F. Zhang,
J. Robertson,
S. Hall ,
Pr R. Chalker
,
If F. Brunell,
K. Dawson ,
Rj J. Potter ,
Y. Guo,
Jt T. Gibbon ,
Vr R. Dhanak,
W. D. Zhang,
Jf F. Zhang,
J. Robertson,
S. Hall ,
Pr R. Chalker
The role of nitrogen doping in ALD Ta2O5 and its influence on multilevel cell switching in RRAM
Download from researchonline.ljmu.ac.uk
Y. Guo,
H. Li ,
J. Robertson
,
J. Robertson
AlN and Al oxy-nitride gate dielectrics for reliable gate stacks on Ge and InGaAs channels
Download from www.repository.cam.ac.uk
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