Christian Kuhn
0000-0003-1735-6209
Technische Universität Berlin
4 papers found
Refreshing results…
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films
Effect of quantum barrier composition on electro-optical properties of AlGaN-based UVC light emitting diodes
MOVPE-grown AlGaN-based tunnel heterojunctions enabling fully transparent UVC LEDs
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