Cheng Liu
0000-0002-1964-5955
Hong Kong University of Science and Technology School of Engineering
3 papers found
Refreshing results…
Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer
O3-sourced atomic layer deposition of high quality Al2O3 gate dielectric for normally-off GaN metal-insulator-semiconductor high-electron-mobility transistors
Mechanisms of thermally induced threshold voltage instability in GaN-based heterojunction transistors
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