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Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 7(38), p. 867-870, 2017

DOI: 10.1109/led.2017.2705721

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Analysis of Clockwise and Counter-Clockwise Hysteresis Characteristics in 3-D NAND Flash Memory Cells

Journal article published in 2017 by Ho-Jung Kang ORCID, Nagyong Choi, Jong-Ho Bae ORCID, Byung-Gook Park ORCID, Jong-Ho Lee ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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