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Royal Society of Chemistry, CrystEngComm, 13(20), p. 1774-1778

DOI: 10.1039/c7ce02162c

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Critical effect of nanometer-size surface roughness of a porous Si seed layer on the defect density of epitaxial Si films for solar cells by rapid vapor deposition

Journal article published in 2018 by Kei Hasegawa ORCID, Chiaki Takazawa, Makoto Fujita, Suguru Noda ORCID, Manabu Ihara ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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