Royal Society of Chemistry, Physical Chemistry Chemical Physics, 13(19), p. 9137-9142
DOI: 10.1039/c7cp00902j
Full text: Unavailable
LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied using High Resolution Transmission Electron Microscopy (HRTEM) and High Angle Annular Dark Field (HAADF) imaging.