Published in
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.
DOI: 10.1109/relphy.2003.1197818
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Defect passivation and dark count in Geiger-mode avalanche photodiodes
Proceedings article published in 2003 by
J. C. Jackson,
G. Healy,
A.-M. Kelleher,
J. Alderman,
J. Donnelly,
P. K. Hurley 
,
A. P. Morrison,
A. Mathewson
,
A. P. Morrison,
A. Mathewson
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