Published in
2009 IEEE International Reliability Physics Symposium
DOI: 10.1109/irps.2009.5173330
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Soft breakdown in MgO dielectric layers
Proceedings article published in 2009 by
E. Miranda 
,
E. O'Connor,
G. Hughes,
P. Casey,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O'Connell,
P. K. Hurley
,
E. O'Connor,
G. Hughes,
P. Casey,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O'Connell,
P. K. Hurley
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