Published in
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
DOI: 10.1109/ipfa.2009.5232695
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Post-breakdown conduction in metal gate/MgO/InP structures
Proceedings article published in 2009 by
E. Miranda 
,
E. O'Connor,
G. Hughes,
P. Casey,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O'Connell,
P. K. Hurley
,
E. O'Connor,
G. Hughes,
P. Casey,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O'Connell,
P. K. Hurley
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