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Royal Society of Chemistry, Physical Chemistry Chemical Physics

DOI: 10.1039/c6cp00273k

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Detection of Trapped Charges in the Blend Films of Polystyrene/SFDBAO Electrets by Electrostatic and Kelvin Probe Force Microscopy

Journal article published in 2016 by Jin Wang, Xiao Wang, Wen-Juan Xu, Linghai Xie, YuYu Liu, Ming-Dong Yi, Wei Huang ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The charge trapping properties of the blend of polystyrene (PS) and a sterically hindered organic semiconductor SFDBAO (spiro[fluorene-9,7-dibenzo[c,h]acridin-5-one]) are investigated by electrostatic and Kelvin probe force microscopy (EFM and KPFM).