Published in
Royal Society of Chemistry, Chemical Communications, 25(51), p. 5414-5417
DOI: 10.1039/c5cc00151j
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The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films
Journal article published in 2015 by
Emanuele Orgiu,
Marco A. Squillaci,
Wassima Rekab,
Karl Börjesson 
,
Fabiola Liscio,
Lei Zhang,
Paolo Samorì
,
Fabiola Liscio,
Lei Zhang,
Paolo Samorì
This paper is made freely available by the publisher.
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