Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Semiconductor Manufacturing, 2(16), p. 207-214
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Improving the accuracy and efficiency of junction capacitance characterization: strategies for probing configuration and data set size
Journal article published in 2003 by
D. MacSweeney,
K. G. McCarthy,
L. Floyd,
R. Duane,
P. Hurley 
,
J. A. Power,
S. C. Kelly,
A. Mathewson
,
J. A. Power,
S. C. Kelly,
A. Mathewson
This paper was not found in any repository, but could be made available legally by the author.
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