Published in
American Chemical Society, Journal of Physical Chemistry C, 47(119), p. 26776-26782, 2015
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Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X-ray Photoelectron Emission Microscopy
Journal article published in 2015 by
Sylvain Pouch,
Michele Amato,
Matteo Bertocchi,
Stefano Ossicini 
,
Nicolas Chevalier,
Thierry Mélin,
Jean-Michel Hartmann,
Olivier Renault,
Vincent Delaye,
Denis Mariolle,
Łukasz Borowik
,
Nicolas Chevalier,
Thierry Mélin,
Jean-Michel Hartmann,
Olivier Renault,
Vincent Delaye,
Denis Mariolle,
Łukasz Borowik
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
Full text: Unavailable
Preprint: archiving allowed
- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
Postprint:
archiving restricted
- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
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