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Royal Society of Chemistry, Physical Chemistry Chemical Physics, 35(15), p. 14634, 2013

DOI: 10.1039/c3cp43802c

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Consistent static and small-signal physics-based modeling of dye-sensitized solar cells under different illumination conditions

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

A numerical device-level model of dye-sensitized solar cells (DSCs) is presented, which self-consistently couples a physics-based description of the photoactive layer with a compact circuit-level description of the passive parts of the cell. The opto-electronic model of the nanoporous dyed film includes a detailed description of photogeneration and trap-limited kinetics, and a phenomenological description of nonlinear recombination. Numerical simulations of the dynamic small-signal behavior of DSCs, accounting for trapping and nonlinear recombination mechanisms, are reported for the first time and validated against experiments. The model is applied to build a consistent picture of the static and dynamic small-signal performance of nanocrystalline TiO2-based DSCs under different incident illumination intensity and direction, analyzed in terms of current-voltage characteristic, Incident Photon to Current Efficiency, and Electrochemical Impedance Spectroscopy. This is achieved with a reliable extraction and validation of a unique set of model parameters against a large enough set of experimental data. Such a complete and validated description allows us to gain a detailed view of the cell collection efficiency dependence on different operating conditions. In particular, based on dynamic numerical simulations, we provide for the first time a sound support to the interpretation of the diffusion length, in the presence of nonlinear recombination and non-uniform electron density distribution, as derived from small-signal characterization techniques and clarify its correlation with different estimation methods based on spectral measurements