Published in
Elsevier, Applied Mathematical Modelling, 10(36), p. 4908-4917, 2012
DOI: 10.1016/j.apm.2011.12.028
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Comparison of electromigration simulation in test structure and actual circuit
Journal article published in 2012 by
Feifei He,
Cher Ming Tan 
This paper is made freely available by the publisher.
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