Published in
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)
DOI: 10.1109/iirw.2014.7049503
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A study of capacitance-voltage hysteresis in HfO2/InGaAs metal-oxide-semiconductor systems
Proceedings article published in 2014 by
Jun Lin,
Scott Monaghan,
Karim Cherkaoui,
Ian M. Povey,
Eamon O'Connor,
Brendan Sheehan,
Paul K. Hurley 
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