Published in
Elsevier, Microelectronics Reliability, 9-11(49), p. 1052-1055
DOI: 10.1016/j.microrel.2009.06.017
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Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks
Journal article published in 2009 by
E. Miranda 
,
J. Martin-Martinez,
E. O’Connor,
G. Hughes,
P. Casey,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O’Connell,
P. K. Hurley
,
J. Martin-Martinez,
E. O’Connor,
G. Hughes,
P. Casey,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O’Connell,
P. K. Hurley
This paper was not found in any repository, but could be made available legally by the author.
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