Published in
American Institute of Physics, Journal of Applied Physics, 2(116), p. 024104
DOI: 10.1063/1.4887517
Links
Tools
A combined capacitance-voltage and hard x-ray photoelectron spectroscopy characterisation of metal/Al2O3/In0.53Ga0.47As capacitor structures
Journal article published in 2014 by
Jun Lin,
Lee Walsh,
Greg Hughes,
Joseph C. Woicik,
Ian M. Povey,
Terrance P. O'Regan,
Paul K. Hurley 
This paper is available in a repository.
Full text: Download
Data provided by 