Published in
American Institute of Physics, Applied Physics Letters, 24(101), p. 241602
DOI: 10.1063/1.4770380
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A combined hard x-ray photoelectron spectroscopy and electrical characterisation study of metal/SiO2/Si(100) metal-oxide-semiconductor structures
Journal article published in 2012 by
Lee A. Walsh,
Greg Hughes,
Paul K. Hurley 
,
Jun Lin,
Joseph C. Woicik
,
Jun Lin,
Joseph C. Woicik
This paper is available in a repository.
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