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IOP Publishing, Applied Physics Express, 6(8), p. 064101, 2015

DOI: 10.7567/apex.8.064101

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Characterization of SiNx/AlN passivation stack with epitaxial AlN grown on AlGaN/GaN heterojunctions by plasma-enhanced atomic layer deposition

Journal article published in 2015 by Yunyou Lu ORCID, Qimeng Jiang, Zhikai Tang, Shu Yang ORCID, Cheng Liu, Kevin J. Chen
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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