Published in
The Electrochemical Society, Journal of The Electrochemical Society, 6(159), p. S17-S17, 2012
DOI: 10.1149/2.119206jes
Links
Tools
Erratum: Charged Defect Quantification in Pt∕Al2O3∕In0.53Ga0.47As∕InP MOS Capacitors [J. Electrochem. Soc., 158, G103 (2011)]
Journal article published in 2012 by
R. D. Long,
B. Shin,
S. Monaghan,
K. Cherkaoui,
J. Cagnon,
S. Stemmer,
P. C. McIntyre,
P. K. Hurley 
This paper is made freely available by the publisher.
Full text: Download
Published version:
archiving forbidden
Data provided by 