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Royal Society of Chemistry, Physical Chemistry Chemical Physics, 30(17), p. 19759-19765, 2015

DOI: 10.1039/c5cp03080c

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Thickness-dependent phase boundary in Sm-doped BiFeO 3 piezoelectric thin films on Pt/Ti/SiO 2 /Si substrates

Journal article published in 2015 by Wei Sun, Jing-Feng Li ORCID, Fangyuan Zhu, Qi Yu, Li-Qian Cheng, Zhen Zhou
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Structure analysis and piezoelectricity characterization revealed a thickness-dependent phase diagram of Bi1−xSmxFeO3 films on Pt(111)/Ti/SiO2/Si substrates.