Royal Society of Chemistry, Analytical Methods, 17(7), p. 7242-7248
DOI: 10.1039/c5ay00574d
Full text: Unavailable
The dynamic wetting technique is described and used to create and aid in analysis of ultrathin (1–5 nm) films on vertically aligned, planar silver substrates of varying microscopic roughness (RMS roughness between 1 and 7 nm).