Published in
The Electrochemical Society, Journal of The Electrochemical Society, 8(151), p. G493
DOI: 10.1149/1.1765678
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Electrical Evaluation of Defects at the Si(100)/HfO[sub 2] Interface
Journal article published in 2004 by
B. J. O’Sullivan,
P. K. Hurley 
,
E. O’Connor,
M. Modreanu ,
H. Roussel,
C. Jimenez,
C. Dubourdieu,
M. Audier,
J. P. Sénateur
,
E. O’Connor,
M. Modreanu ,
H. Roussel,
C. Jimenez,
C. Dubourdieu,
M. Audier,
J. P. Sénateur
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