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Royal Society of Chemistry, Lab on a Chip, 15(11), p. 2481, 2011

DOI: 10.1039/c0lc00676a

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Probing liquid surfaces under vacuum using SEM and ToF-SIMS

Journal article published in 2011 by Li Yang, Xiao-Ying Yu ORCID, Zihua Zhu, Martin J. Iedema, James P. Cowin
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We report a newly developed self-contained interface for high-vapor pressure liquid surfaces to vacuum-based analytical instruments. It requires no wires or tubing connections to the outside of the instrument and uses a microfluidic channel with a 3 μm diameter window into the flowing fluid beneath it. This window supports the liquid against the vacuum by the liquid's surface tension and limits the high-density vapor region traversed by the probe beams to only a few microns. We demonstrate this microfluidic interface for in situ liquid surfaces in a time-of-flight secondary ion mass spectrometer (ToF-SIMS) and a scanning electron microscope (SEM) with chemical analysis.