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American Institute of Physics, Applied Physics Letters, 1(120), p. 012901, 2022

DOI: 10.1063/5.0077840

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Impact of interlayer insulator formation methods on HfO<sub>x</sub> ferroelectricity in the metal–ferroelectric–insulator–semiconductor stack

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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