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Royal Society of Chemistry, Faraday Discussions, (237), p. 27-39, 2022

DOI: 10.1039/d2fd00062h

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Visualizing optically-induced strains by five-dimensional ultrafast electron microscopy

Journal article published in 2022 by A. Nakamura ORCID, T. Shimojima ORCID, K. Ishizaka ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Optically-induced nanoscale strain dynamics in nano-fabricated Si thin films are quantitatively visualized on the picosecond scale. A newly developed ultrafast five-dimensional convergent beam electron diffraction method is introduced.