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Royal Society of Chemistry, Materials Chemistry Frontiers, 22(5), p. 7931-7963, 2021

DOI: 10.1039/d1qm00969a

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Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in the materials community, however as made apparent by recent reviews highlighting it's misuse, it is a practice which is often misunderstood.