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Electrically active interface defects in Si/SiO2 and Si(100)/HfO2 structures

Proceedings article published in 2005 by P. K. Hurley ORCID, B. J. O'Sullivan
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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