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Paul Hurley
Hurley et al., 2006
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@inproceedings{Hurley2006, author = {Hurley, P. K. and Cherkaoui, K. and O'Connor, E. and Hall, S. and Lu, Y. and Buiu, O. and Lemme, M. C. and Gottlob, H. D. B. and Schmidt, M. and Raeissi, B. and Piscator, J. and Engstrom, O.}, month = {jan}, title = {A study of interfacial defects in HfO2, LA2O 3, and GD2O3 thin films on silicon substrates}, year = {2006} }
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A study of interfacial defects in HfO2, LA2O 3, and GD2O3 thin films on silicon substrates
Proceedings article published in 2006 by
P. K. Hurley
,
K. Cherkaoui
,
E. O'Connor
,
S. Hall
,
Y. Lu
,
O. Buiu
,
M. C. Lemme
,
H. D. B. Gottlob
,
M. Schmidt
,
B. Raeissi
,
J. Piscator
,
O. Engstrom
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