Published in

Nanoscale Advances, 2(4), p. 502-509, 2022

DOI: 10.1039/d1na00794g

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Fabry–Perot interferometric calibration of van der Waals material-based nanomechanical resonators

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Multilayer interference approach is applied to confocal microscopy images of an electromotive-driven van der Waals material nanomechanical resonator to extract its thickness, gap height, and motional amplitude in the frequency and spatial domains.