Published in
Royal Society of Chemistry, CrystEngComm, 7(23), p. 1628-1633, 2021
DOI: 10.1039/d0ce01572e
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Highly-crystalline 6 inch free-standing GaN observed using X-ray diffraction topography
Journal article published in 2021 by
Jaemyung Kim,
Okkyun Seo 
,
L. S. R. Kumara,
Toshihide Nabatame,
Yasuo Koide,
Osami Sakata
,
L. S. R. Kumara,
Toshihide Nabatame,
Yasuo Koide,
Osami Sakata
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Abstract
We demonstrate the crystal quality of a 6 inch (0001) plane free-standing GaN substrate grown using a Na-flux based liquid phase epitaxy method.