Published in

Royal Society of Chemistry, Nanoscale, 4(13), p. 2626-2631, 2021

DOI: 10.1039/d0nr07954e

Links

Tools

Export citation

Search in Google Scholar

Spectromicroscopy and Imaging of Photoexcited Electron Dynamics at in-plane Silicon pn Junction

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Revealing the influence of doping patterns on the photoelectron spectra and dynamics at in-plane silicon PN junctions using a time-resolved photoemission electron microscope.