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IOP Publishing, Semiconductor Science and Technology, 12(35), p. 125003, 2020

DOI: 10.1088/1361-6641/abb5e4

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Suppression of reverse drain induced barrier lowering in negative capacitance FDSOI field effect transistor using oxide charge trapping layer

Journal article published in 2020 by Kitae Lee ORCID, Sihyun Kim ORCID, Jong-Ho Lee ORCID, Daewoong Kwon ORCID, Byung-Gook Park ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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