Published in
Royal Society of Chemistry, Nanoscale, 24(12), p. 13103-13112, 2020
DOI: 10.1039/d0nr01847c
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Evolution of short-range order in chemically and physically grown thin film bilayer structures for electronic applications
Journal article published in 2020 by
Ann-Christin Dippel 
,
Olof Gutowski,
Lars Klemeyer ,
Ulrich Boettger,
Fenja Berg,
Theodor Schneller,
Alexander Hardtdegen ,
Stephan Aussen ,
Susanne Hoffmann-Eifert ,
Martin V. Zimmermann
,
Olof Gutowski,
Lars Klemeyer ,
Ulrich Boettger,
Fenja Berg,
Theodor Schneller,
Alexander Hardtdegen ,
Stephan Aussen ,
Susanne Hoffmann-Eifert ,
Martin V. Zimmermann
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Abstract
The local atomic structure of two stacked thin films is probed by applying grazing incidence x-ray total scattering at variable incidence angle and resolving pair distribution functions for each individual layer.