Royal Society of Chemistry, Nanoscale, 18(12), p. 10090-10097, 2020
DOI: 10.1039/d0nr00322k
Full text: Unavailable
Focused Electron Beam Induced Deposition (FEBID) for magnetic tip fabrication is presented in this work as an alternative to conventional sputtering-based Magnetic Force Microscopy (MFM) tips.